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Cover of Scanning probe microscopies

Scanning probe microscopies

by A. De Stefanis, A. A. G. Tomlinson

2001 94 pages eng

Materials science, especially electronics, continues its miniaturization trend from the scale of microns to nanometers-- thanks to scanning tunneling microscopy (STM) technology, which integrates measurement and fabrication in a single step. The authors, for whom no affiliation is listed, overview t…

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